ICCES’11 SPECIAL SYMPOSIUM ON MODERN EXPERIMENTAL METHODS IN MECHANICS, ENGINEERING, AND THE SCIENCES
As part of ICCES’11, April 18-21, 2011, Nanjing, China
Organizing Committee
Co-Chairs: Fu-Pen Chiang (USA), YiIan Kang (China), Huimin Xie (China), Xiaoyuan He (China)
International Advisory Committee
Anand Asundi (Singapore), John Dear (UK), Fulong Dai (China), Ioannis Chasiotis (USA),
Michael Dudley (USA), Emmanuel Gdoutos ( Greece ), Ruhua Fang (China), Francesco Ginesu ( Italy), Xiaoyuan He (China), Howard Huang ( Canada), Jonathan Huntley (UK), Helena Jin (USA), Akira Kato (Japan), Keyu Li (USA), Hongbing Lu (USA), Hua Lu (Canada), Michael Y.Y. Hung ( USA & Hong Kong, China), Chien-Ching Ma (Taiwan), Hong Miao (China), Luciano Pirodda (Italy), Romon Rodriques( Mexico) , Cesar Sciammarella (USA), Hareesh Tippur (USA), Junlan Wang (USA), Wei-Chung Wang ( Taiwan), Xiaoping Wu (China), Toru Yashizawa (Japan), Qifeng Yu (China), Song Zhang (USA)
Goals of the Symposium:
Experiments are an integral part of engineering and the sciences, and indeed they are often the impetus for the advancement of science. The goal of this special symposium is to bring experimental researchers of various disciplines together to exchange ideas, to encourage synergy and cross-fertilization. Topics to be included in the symposium are, but not limited to:
Optical methods of stress analysis, Optical Metrology, Holographic interferometry, Speckle interferometrty, ESPI, Speckle photography, Digital image correlation, Nondestructive evaluation and inspection (NDE & NDI). Moire’ methods, Moiré interferometry , Biomechanics, Biomedical engineering, Material Characterization, Composite materials, Vibration, Impact, and acoustics, Synchrotron light source applications, Electron microscopy (SEM, TEM, etc.), AFM, X-ray tomography. Micro/Nano measurement techniques, 3-D shape measurements, Dynamic measurement techniques, infrastructure inspection techniques, fractal techniques, industrial applications.
Special Lectures:
Theme Lecture: “The State of Art of Optical Stress Analysis”, Fu-pen Chiang (USA)
Keynote Lecture:” Synchrotron X-ray Topography Characterization of Defects and Their Origins in Crystals”, Michael Dudley ( USA)
Keynote Lecture: “Dynamic and Impact Response of Materials and Structures”, John Dear (UK)
Keynote Lecture: “ Video-Metrics Techniques for Measuring Large Structure Deformation and Large-scale Motion Analysis”. Qifeng Yu (China)
Selected papers from this symposium will be published in a book.
Please submit abstracts to the following website directly
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