用电子散斑法对纯镍薄片弯曲变形的测量

MEASUREMENT OF DEFORMATION OF PURE Ni FOILS BY SPECKLE PATTERN INTERFEROMETRY

  • 摘要: 由于建立的电子散斑法有位移测量精度高、量程大的特点,且自制的力传感器灵敏度高、量程相对较大,从而保证了本实验中镍片在三点弯中的反应被全程、精确地记录下来. 基于时间序列的电子散斑法,测出了10\sim100\,\mum不同厚度的纯镍薄片在三点弯下的载荷-位移曲线,其中包括弹性部分以及进入塑性屈服两个阶段,据此可以推出不同厚度镍片的三点弯刚度. 实验表明镍片的抗弯刚度受其厚度的影响很大,尤其在薄片厚度较小时表现得更为明显,即表现出明显的尺度效应.

     

    Abstract: By employing the sequence pulse counting method (SPCM) anda high sensitive micro load-sensor, a precise and sensitive measurementsystem was established to measure the load-deflection curves of pure Nifoils (purity 99.99%) under three-point micro bending. The wholedeformation field and the applied force were recorded precisely andcompletely. On the basis of the measured curves of the pure Ni foil beamswith various thickness (10 -100um), it is found that the elasticbending rigidity is strongly dependent upon the thickness of the microbeams, that is, an obvious size effect is demonstrated.

     

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